Conference 6205
Room: Sun Breakout 5-6
Monday-Thursday 17-20 April 2006
Proceedings of SPIE Vol. #6205
Conference Chairs: Jonathan J. Miles, James Madison Univ.; G. Raymond Peacock, Temperatures.com, Inc.; Kathryn M. Knettel, United Space Alliance
Program Committee: Lee R. Allen, Allen Applied Infrared Technology; Nicolas P. Avdelidis, TWI Technology Ctr. Wales (United Kingdom); Douglas D. Burleigh, Surfside Consulting; Antonio Colantonio, Public Works and Government Services Canada (Canada); Fred Colbert, Colbert Infrared Services, Inc.; K. Elliott Cramer, NASA Langley Research Ctr.; Ralph B. Dinwiddie, Oak Ridge National Lab.; Ermanno G. Grinzato, Consiglio Nazionale delle Ricerche (Italy); Sheng-Jen Hsieh, Texas A&M Univ.; Herbert Kaplan, Honeyhill Technical Co.; Timo T. Kauppinen, VTT Elektroniikka (Finland); Jack M. Kleinfeld, Kleinfeld Technical Services, Inc.; Dennis H. LeMieux, Siemens AG; Sven-Åke Ljungberg, Univ. of Gävle (Sweden); Robert P. Madding, FLIR Systems, Inc.; Xavier P. Maldague, Univ. Laval (Canada); Pierre Potet, CEDIP Infrared Systems (France); Piotr Pregowski, Pregowski Infrared Services (Poland); Austin A. Richards, FLIR Systems, Indigo Operations; Andrés E. Rozlosnik, SI Termografía Infrarroja (Argentina); Morteza Safai, Boeing Co.; Takahide Sakagami, Osaka Univ. (Japan); R. James Seffrin, Infraspection Institute; Steven M. Shepard, Thermal Wave Imaging, Inc.; Gregory R. Stockton, Stockton Infrared Thermograph; Vladimir P. Vavilov, Tomsk Polytechnic Univ. (Russia); Lisa West Åkerblom, FLIR Systems, Inc. (Sweden)
Meetings of related interestAmerican Society for Testing and Materials
Tues. 6:30 to 7:15 pm · Room: Sun Breakout 5-6 ISPOTWed 5:30 to 6:30 pm · Room: Sun Breakout 5-6 Meeting of the SPIE International Thermosense Technical GroupTues. 7:30 to 9:00 pm · Room: Sun Breakout 5-6 Chair: Ralph Dinwiddie, Oak Ridge National Lab. The Thermal Sensing for Diagnostics and Control (Thermosense) Technical Group of SPIE provides a forum for information exchange on relevant matters among technical group members, committees involved in thermosense technology, and SPIE. This is the most direct method of providing feedback to SPIE on the conduct and content for future Thermosense conferences as well as on other thermosense activity. This year the group will host a Thermographic Image contest and reception with prizes
Contact Ralph Dinwiddie at: All members and nonmembers interested in participating in this event, or those wishing to join in the coordination process for future conferences and related activities are encouraged to attend. |
|
Vendor Presentations and Reception What's New in Hardware and Software at the 2006 DSS Exhibition?Mon. 5:30 to 8:00 pm · Room: Sun Breakout 5-6 Chairs: G. Raymond Peacock, Temperatures.com, Inc.; Andrés E. Rozlosnik, SI Termografía Infrarroja (Argentina) For the second year, in conjunction with the Thermosense XXVIII Conference, hardware and software vendors will give brief presentations in what is new this year in their product lines that impact thermal imaging practices and applications.
Axsys Technologies CEDIP Defense and Security
CEDIP Industrial & Thermography Presenter: Pierre Bremond
FLIR Systems, Inc.
Goodrich Sensors Unlimited
GORATEC Technology GmbH & Co. KG Presenter: Gottfried Rampl
JCD Publishing Company Title: MAVIISS: New Imaging System Simulation Software
Jenoptik Laser, Optik, Systeme GmbH
Infrared Solutions
Nippon Avionics Co., Ltd. (AVIO) Title: New Thermal Video System from Nippon Avionics
RedShift Systems
Thermoanalytics
Thermoteknix, Ltd. Title: What's New in Thermal Imaging? Thermoteknix Pushes the Boundaries of Size and Performance |
Chairs: G. Raymond Peacock, Temperatures.com, Inc.; Robert P. Madding, FLIR Systems, Inc.
8:00 am: Design and characterization of Si and InGaAs pyrometers for NIST radiance temperature scale realization between 200°C and 962°C, M. Noorma, S. N. Mekhontsev, V. B. Khromchenko, A. Gura, M. Litorja, L. M. Hanssen, National Institute of Standards and Technology [6205-01]
8:20 am: Water heat pipe blackbody as reference spectral radiance source between 50°C and 250°C, M. Noorma, National Institute of Standards and Technology and Helsinki Univ. of Technology (Finland); S. N. Mekhontsev, V. B. Khromchenko, M. Litorja, J. Zeng, L. M. Hanssen, National Institute of Standards and Technology [6205-02]
8:40 am: IR spectral characterization of customer blackbody sources: first calibration results, S. N. Mekhontsev, M. Noorma, L. M. Hanssen, National Institute of Standards and Technology [6205-03]
9:00 am: The new NIST Advanced Infrared Radiometry and Imaging (AIRI) facility, S. N. Mekhontsev, B. K. Tsai, M. Litorja, L. M. Hanssen, G. T. Fraser, National Institute of Standards and Technology [6205-04]
9:20 am: Emissivity of IR calibrators with V-grooved surfaces: theory and measurement, L. M. Hanssen, A. V. Prokhorov, S. N. Mekhontsev, National Institute of Standards and Technology [6205-06]
Coffee Break 9:40 to 10:30 am
Chairs: G. Raymond Peacock, Temperatures.com, Inc.; Robert P. Madding, FLIR Systems, Inc.
10:30 am: Variable temperature blackbody sources as primary standards, K. Irani, Mikron Infrared, Inc. [6205-07]
10:50 am: A universal blackbody calibration source for temperature span from ambient to 2300° C, K. Irani, Mikron Infrared, Inc. [6205-08]
11:10 am: In-line blackbody for in-process verification of infrared line-scanner calibration, T. J. Orr, U. Rajput, M. Cilfone, Visteon Corp. [6205-09]
11:30 am: Temperature uncertainty of IR thermal imager calibration, G. R. Peacock, Temperatures.com, Inc. [6205-10]
11:50 am: Radiation thermometry of semitransparent silicon wafers near room temperature, T. Iuchi, Y. Ikeda, Toyo Univ. (Japan) [6205-11]
Lunch/Exhibition Break 12:10 to 1:10 pm
Chairs: Austin A. Richards, FLIR Systems, Inc.; G. Raymond Peacock, Temperatures.com, Inc.
1:10 pm: Development of a new infrared thermography with inter-atmospheric window and an advanced image processing technique, D. Sato, T. Komiyama, Concrete Soft Technical Engineering Corp. (Japan); T. Sakagami, S. Kubo, Osaka Univ. (Japan) [6205-12]
1:30 pm: Advances in applications for aerial infrared thermography, G. R. Stockton, Stockton Infrared Thermographic Services, Inc.; A. Tache, Stockton Infrared Thermographic Services [6205-13]
1:50 pm: Thermal radiation properties of different metals, W. Bauer, A. Moldenhauer, Univ. Duisburg-Essen (Germany); H. Oertel, GIWEP Muelheim (Germany) [6205-68]
2:10 pm: Infrared astronomy with NASA's new Spitzer Space Telescope (Invited Paper), R. D. Gehrz, Univ. of Minnesota [6205-15]
2:50 pm: Applications for a NIR filter wheel camera, A. A. Richards, S. D'Souza, FLIR Systems, Inc. [6205-17]
Coffee Break 3:10 to 3:40 pm
Chairs: Herbert Kaplan, Honeyhill Technical Co.; Kathryn M. Knettel, American Infrared Testing & Consulting, Inc.
3:40 pm: Issues in advanced image registration for multi-UAV platform applications (Invited Paper), O. J. Watkins, M. I. Smith, J. P. Heather, Waterfall Solutions Ltd. (United Kingdom) [6205-16]
4:10 pm: Superimposing visible and infrared images, K. R. Johnson, T. McManus, R. N. Schmidt, Infrared Solutions, Inc. [6205-18]
4:30 pm: ARISTMS: a new capability, M. Wilson, P. Coulter, MilSys Technologies LLC [6205-19]
4:50 pm: Robust thermal calibration and three-dimensional mapping of object surface temperatures, S. Prakash, T. M. Caelli, T. Raupach, P. Y. Lee, The Australian National Univ. (Australia) [6205-20]
5:10 pm: Summary Discussion
Student Poster Briefs and Student Poster AwardsTues. 5:30 to 5:50 pm Chairs: Jonathan J. Miles, James Madison Univ.; Morteza Safai, The Boeing Co. Student posters will be presented as a 5-minute oral presentation. Student posters will also be displayed Tuesday evening in the main poster session. |
Infrared Image Gallery AwardTues. 5:50 to 6:30 pm · Room: Sun Breakout 5-6 Chairs: Ralph B. Dinwiddie, Oak Ridge National Lab. |
The following posters will be displayed during the poster session Tuesday evening in the Osceola Ballroom C. Authors will be present for discussion during the poster session between 6:00 and 7:30 pm.
|
Authors may set-up their posters between 10:00 am and 5:30 pm on Tuesday. Posters that are not set-up by the 5:30 pm cut-off time will be considered no-show and their manuscript will not be published. All posters must be removed no later than 8:30 pm. |
Chairs: Herbert Kaplan, Honeyhill Technical Co.; Morteza Safai, The Boeing Co.
8:20 am: Thermography of surface-treated saw blades and saw guides, R. B. Dinwiddie, Oak Ridge National Lab.; T. E. Steffner, Better Than New, LLC [6205-21]
8:40 am: IR imaging study on heater performance of outside rearview mirrors for automobiles, H. Wang, Oak Ridge National Lab.; T. England, Delbar Products Inc. [6205-22]
9:00 am: Dual-band MWIR/LWIR QWIP ratio radiometer for absolute skin temperature measurements, G. M. Williams, A. M. Barter, Voxtel [6205-23]
9:20 am: Final cook temperature monitoring, J. M. Stewart, Georgia Institute of Technology [6205-24]
9:40 am: Breast cancer monitoring using the thermography approach: induction trials in a university hospital in Greece (Presentation Only), N. P. Avdelidis, TWI Technology Ctr. Wales (United Kingdom); E. Athanassiou, A. Poultsidi, Univ. of Thessaly (Greece) [6205-25]
10:00 am: Application of Dynamic Infrared Imaging (DIRI®) in reconstructive surgery, M. Pawlowski, C. Wang, F. Jin, M. Salvitti, Advanced BioPhotonics, Inc.; X. Tenorio, Geneva Univ. Hospital (Switzerland) [6205-26]
Coffee Break 10:20 to 10:40 am
Chairs: Andrés E. Rozlosnik, SI Termografía Infrarroja (Argentina); Herbert Kaplan, Honeyhill Technical Co.
10:40 am: Thermography and neural networks for SRAM voltage stress prediction, S. Hsieh, K. Sharma, Texas A&M Univ. [6205-27]
11:00 am: On-board SRAM signal density stress prediction, S. Hsieh, K. Sharma, Texas A&M Univ. [6205-28]
11:20 am: The effects of substrates and environmental pressure on the transient thermal response of a resistance temperature detector (RTD), J. Post, Jr., M. Imran, A. Bhattacharyya, Univ. of Arkansas/Little Rock [6205-29]
11:40 am: Experimental determination of local convection heat transfer coefficient field using two-dimensional and dynamic of infrared thermography (2DD-IRT) method, J. A. Patorski, F. Groeschel III, Paul Scherrer Institut (Switzerland) [6205-30]
12:00 pm: Flow visualization of heated CO2 gas using thermal imaging, H. W. Yoon, National Institute of Standards and Technology [6205-31]
Annual Adronicus G. Kantsios AwardWed. 12:20 to 12:30 pm · Room: Sun Breakout 5-6 Presented by: Kathryn M. Knettel, United Space Alliance |
Lunch/Exhibition Break 12:30 to 1:50 pm
Chairs: Pierre Bremond, CEDIP Infrared Systems (France); Takahide Sakagami, Osaka Univ. (Japan); Douglas D. Burleigh, Surfside Consulting
1:50 pm: Calorimetric analysis of some thermoplastic polymers, C. André, V. Huon, S. Moreau, B. Wattrisse, J. M. Muracciole, R. Peyroux, Univ. Montpellier II (France); B. Pierre, CEDIP Infrared Systems (France) [6205-33]
2:10 pm: An application of the differential thermographic technique for welded joints fatigue evaluation, C. Casavola, U. Galietti, D. Modugno, Politecnico di Bari (Italy) [6205-34]
2:30 pm: High-speed experimental analysis of orthogonal planing using high-speed infrared camera, P. Guégan, A. Piotou, Ecole Centrale de Nantes (France); P. Bremond, CEDIP Infrared Systems (France) [6205-35]
Coffee Break 2:50 to 3:30 pm
Chairs: Timo T. Kauppinen, VTT Elektroniikka (Finland); Nicolas P. Avdelidis, TWI Technology Ctr. Wales (United Kingdom)
3:30 pm: First responder thermal imaging cameras: establishment of significant performance testing conditions, F. Amon, J. M. Rowe, A. Hamins, National Institute of Standards and Technology [6205-37]
3:50 pm: Techniques for thermographic imaging in sunlight and shadow, K. M. Knettel, American Infrared Testing & Consulting, Inc. [6205-38]
4:10 pm: The use of near-IR imaging in 19th Century artwork, R. B. Dinwiddie, Oak Ridge National Lab.; S. Dean, FAMFIVE Productions [6205-39]
4:30 pm: Certification of building thermographers: experiences after three courses, T. T. Kauppinen, VTT Elektroniikka (Finland); S. Paloniitty, Häme Polytechnic (Finland); J. Krankka, Rakennusteollisuuden Koulutuskeskus RATEKO (Finland) [6205-40]
4:50 pm: Advanced techniques in IR thermography (Invited Paper), J. L. Grossman, Hi-Tech Inspection Services, Inc. [6205-41]
Chairs: Douglas D. Burleigh, Surfside Consulting; K. Elliott Cramer, NASA Langley Research Ctr.
8:00 am: Enhanced thermographic signal reconstruction, S. M. Shepard, Y. Hou, J. R. Lhota, T. Ahmed, Thermal Wave Imaging, Inc. [6205-42]
8:20 am: Discrete signal transforms as a tool for processing and analyzing pulsed thermographic data, C. Ibarra-Castanedo, D. A. Gonzalez, F. Galmiche, X. P. Maldague, H. Bendada, Univ. Laval (Canada) [6205-43]
8:40 am: Digitized frequency modulated thermal-wave imaging for nondestructive testing applications, R. Mulaveesala, S. Tuli, Indian Institute of Technology Delhi (India) [6205-44]
9:00 am: Transient thermal NDT & E of defects in building materials, N. P. Avdelidis, TWI Technology Ctr. Wales (United Kingdom); D. Stavrakas, A. Moropoulou, National Technical Univ. of Athens (Greece) [6205-45]
9:20 am: Peculiarities of detecting hidden corrosion in thick metals by transient IR thermography, E. G. Grinzato, Consiglio Nazionale delle Ricerche (Italy) [6205-46]
9:40 am: Signal-to-noise studies on thermographic data with fabricated defects for defence structures, J. N. Zalameda, NASA Langley Research Ctr.; N. Rajic, Defence Science and Technology Organisation (Australia); M. Genest, National Research Council Canada (Canada) [6205-47]
Coffee Break 10:00 to 10:30 am
10:30 am: Determining thermal diffusivity components in thick anisotropic composites, V. P. Vavilov, Tomsk Polytechnic Univ. (Russia); D. D. Burleigh, Surfside Consulting [6205-48]
10:50 am: Quantitative nondestructive evaluation of delamination damage in CFRP for space structures, T. Sakagami, S. Kubo, Osaka Univ. (Japan); Y. Hyodo, T. Ogasawara, Japan Aerospace Exploration Agency (Japan); T. Nishimura, D. Imanishi, Osaka Univ. (Japan); M. R. Schmitt, Purdue Univ. [6205-49]
Chairs: K. Elliott Cramer, NASA Langley Research Ctr.; Douglas D. Burleigh, Surfside Consulting
11:10 am: Status of thermal NDT of space shuttle materials at NASA, K. E. Cramer, W. P. Winfree, NASA Langley Research Ctr.; K. Hodges, NASA Johnson Space Ctr.; A. M. Koshti, The Boeing Co.; D. R. Ryan, United Space Alliance; W. W. Reinhardt, The Boeing Co. [6205-50]
11:30 am: Development on on-orbit camera hardware, M. J. Gazarik, NASA Langley Research Ctr. [6205-51]
Lunch/Exhibition Break 11:50 am to 1:10 pm
Chairs: Douglas D. Burleigh, Surfside Consulting; K. Elliott Cramer, NASA Langley Research Ctr.
1:10 pm: Detection of surface cracks, pits, and scratches in highly reflective and low-emissive materials by using laser beam trapping and infrared imaging technique, M. Safai, The Boeing Co. [6205-52]
1:30 pm: Potential and restrictions of eddy current lockin-thermography, G. Riegert, A. Gleiter, G. Busse, Univ. Stuttgart (Germany) [6205-53]
1:50 pm: Advanced ultrasound activated lockin-thermography for defect-selective depth-resolved imaging, A. Gleiter, G. Riegert, G. Busse, Univ. Stuttgart (Germany) [6205-54]
2:10 pm: Airborne detection of natural gas leaks from ground pipelines by using a laser system operating in visual, near-IR, and mid-IR wavelength bands, V. P. Vavilov, Tomsk Polytechnic Univ. (Russia) [6205-55]
2:30 pm: Thermographic identification of wetted insulation on pipelines in the Arctic oilfields, J. J. Miles, James Madison Univ.; A. Dahlquist, C. Dash, ConocoPhillips Alaska Inc. [6205-56]
Coffee Break 2:50 to 3:20 pm
Chairs: Douglas D. Burleigh, Surfside Consulting; K. Elliott Cramer, NASA Langley Research Ctr.
3:20 pm: Bridge concrete deteriorating diagnosis by infrared thermography, H. Shibata, N. Fukuyama, J. Sakuma, J. Mochizuki, Y. Kimura, Nippon Avionics Co Ltd (Japan) [6205-60]
3:40 pm: Moisture and heat balance during building surveys, O. V. Lebedev, O. N. Budadin, D. V. Kirzhanov, V. V. Avramenko, Russian Academy of Sciences (Russia) [6205-57]
4:00 pm: Thermal testing of building envelopes, O. V. Lebedev, Russian Academy of Sciences (Russia) and Technological institute WEMO (Russia); O. N. Budadin, D. V. Kirzhanov, V. V. Avramenko, Russian Academy of Sciences (Russia) [6205-58]